Many semiconductor and electronic device tests involve sourcing voltages and measuring currents as quickly as possible. Overall test time is a combination of charge time, measure time, and discharge time, as well as the time to setup and process the test. Furthermore, engineers need to invest additional time and effort to develop their data collection/reporting systems to accurately reflect the raw data.

Keithey's KickStart and IV Tracer software solutions allow you to harness the power of Keithley’s Test Script Processor (TSP®) technology without having to write a single line of code! By plotting data immediately and offering quick statistical summaries of the data in the reading table, KickStart allows you to gather insights faster and make the decisions you need to move on to the next stage of device development.

Join us for a hands-on demonstration where we will test multiple semiconductor devices using KickStart and IV Tracer on our industry -leading source measure units (SMUs).

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