Several error sources can significantly impact the accuracy of low current measurements. Improper connection of the ammeter, for instance, can introduce measurement errors. Additionally, the ammeter's voltage burden and input bias current can influence measurement accuracy.

The source resistance of the device under test plays a role in the noise performance of a feedback ammeter. External error sources, such as leakage current from cables and fixtures, further underscore the importance of selecting the appropriate cable for low current measurements. Ensuring the right cable choice is critical to guarantee precise and dependable readings.

Join this on demand webinar where we'll delve into the intricacies of low current measurements, exploring practical solutions and best practices to enhance accuracy.

Don't miss this opportunity to deepen your understanding and optimize your measurement processes. Register now!

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Presenter

Stephen Tang

Eric Teh

Regional Applications Engineer
 

As our Regional Applications Engineer, Eric helps fellow engineers accelerate project progress in multiple applications in power electronics, semiconductor characterization and material engineering.

Prior to Tektronix, Eric was a Test Development Engineer with Keysight Technologies – Network Emulator Simulation (NES). He also has working knowledge with test automation with different test & measurement solution.

Eric receive his Bachelor of Electronic Engineering (Communication and Computer) from The National University of Malaysia (UKM).​