Wide band-gap semiconductors (SiC/GaN) are commonly used along with traditional silicon in high performance applications due to their higher rated switching frequencies, voltage/currents and operating temperatures.
DC instrumentation must be capable of outputting high voltage/currents to test these wide bandgap devices, while providing sufficient measurement resolution for accurate characterization. For example, GaN MOSFETs can have on-resistances (RdsOn) with single digit milliohm values. This can be beyond the capabilities of typical automated test equipment (ATE) testers.
Join us for a live demonstration where we will exhibit how Keithley's high power instruments can help you characterize such high performance devices.
As Regional Applications Engineer, Joel focuses on Source Measurement Units and Keithley System Solutions. He covers applications from semiconductor characterization to customized test systems in production and R&D.
Joel was previously a R&D Digital Design Engineer at Aemulus Corporation in Malaysia. He was responsible for writing firmware/drivers for automated test solution, specifically for SourceMeters.
He graduated from University of Southampton, UK with a Bachelor Degree in Electronic Engineering.