Got Jitter? Diagnosing Power Integrity and Signal Integrity Problems

Are the bit errors in your data caused by the power supply or sources inside the digital channel? Let's end the dispute by examining the connection between jitter and power integrity. We'll highlight sources of noise likely to cause jitter on serial data lines and look at other power analysis methods from 3-phase inverter analysis to isolated probing.

Attendees of this webinar will learn how to:

  • Detect ripple and its effects on a high-speed serial clock using power rail analysis software
  • Mitigate signal integrity problems cause by the PDN (power distribution network)
  • See additional capabilities of modern oscilloscopes make complex power measurements easier and more repeatable

Cameron Lowe, Field Applications Engineer at Tektronix, is looking forward to sharing his knowledge and answering all of your jitter questions.

Watch the on demand  webinar today!

Watch the webinar


photo of speaker

Cameron Lowe

Field Applications Engineer, Tektronix

Cameron Lowe is a field applications engineer for Tektronix supporting the time and frequency domain product portfolio in the Midwestern region of the U.S. He has a bachelor’s degree in Electrical Engineering from the University of Dayton.