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TEK:INSIGHTS

Tips, Tricks and Traps: Sharing Test Data Across the Bench and Into the Cloud


Sign up for our webinar and learn about the new, smarter ways to share your bench instrument data. 

Accessing data you gather with a bench instrument has historically been very difficult. At first, you had to physically be with your equipment to use it. In the 80s, the introduction of GPIB and other protocols made it possible to use your equipment at a distance. Now, there are more ways than ever before to use and take data from test equipment at a distance.

Join us to compare and contrast different methods of untethering your instrument data from your bench. We'll discuss accessing your data locally and remotely, from custom Python code to automatic cloud uploads. We’ll also discuss techniques you can use on your equipment to optimize data for storage.

Register for this webinar learn about:

  • Storing test data in the cloud
  • Sharing data from different bench instruments
  • Optimizing data for sharing

Sign up now to watch this webinar. 

REGISTER FOR THE WEBINAR

Presenter:

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Rick Kuhlman

Head of Product | Tektronix, Initial State

Rick has been managing products in software and hardware for over 15 years. He serves as Head of Product at Initial State, an IoT platform acquired by Tektronix in 2018. Before that, he was responsible for product development at multiple IoT hardware/software companies and served as the Director of Product at Invodo, an ecommerce video company. He gained deep T&M software product management experience from his time at National Instruments where he served as a LabVIEW product manager for cloud, FPGA, and embedded software.

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Brad Odhner

Technical Marketing Manager, Tektronix

Brad Odhner is a Technical Marketing Manager with responsibility for the Keithley line of products from Tektronix. Prior to this he was a Keithley Applications Engineer. He holds a degree in physics from Case Western Reserve University. His experience with the Keithley product line has ranged from extremely sensitive semiconductor measurements to high volume switching and data acquisition systems.